- Bandwidth:40/20GHz
IL: <3dB
Connector: 2.92mm/SMA-F
Size: 51x38x12mm
Probe Force: 80gm(Typ)
40/20GHz Differential Probe
40/20GHz差動プローブ
製品概要
D-Probe series is designed for signal integrity and RF testing. Its strong beryllium copper (BeCu) tips are perfect for direct probing of test pads on uneven surfaces, such as solder bumps. With only two signal pins, D-Probe can perform accurate measurements without the need of nearby ground pads. For example, many DDR chips do not have enough ground pins around their differential signals. In this case, typical GSSG probes cannot be used.
