30/20GHz S-Probe 画像

30/20GHz S-Probe

30/20GHz S-Probe

型番
SP-GR-xxxxx
製品カテゴリ
メーカ

製品概要

S-Probe series is designed for RF, power integrity, and signal integrity testing. Its strong beryllium copper (BeCu) tips are perfect for direct probing of uneven surfaces, such as solder pads and components. Microprobes are not suitable for this type of measurements due to their fragility.

特長

  • Bandwidth: DC~30/20GHz
  • IL: <3dB
  • Connector: 2.92mm/SMA-F
  • Size: 38x20x12mm
  • Probe Force: 50gm(typ)
  • Bandwidth: DC~30/20GHz
  • IL: <3dB
  • Connector: 2.92mm/SMA-F
  • Size: 38x20x12mm
  • Probe Force: 50gm(typ)

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