Wafer-level Edge-coupling Tester image

Wafer-level Edge-coupling Tester

Wafer-level Edge-coupling Tester

PART NO.
OPAL-EC
CATEGORY
SUPPLIER

SUMMARY

The OPAL-EC station is part of the OPAL family of test stations dedicated to PIC testing, offering different performance, capability and throughput levels.

FEATURES

Work Area:
50x50/100x100/Φ300mm
Coupling Mode:
Surface&Edge Coupling
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