Multi-die PIC Probe Tester image

Multi-die PIC Probe Tester

Multi-die PIC Probe Tester

PART NO.
OPAL-xx
CATEGORY
SUPPLIER

SUMMARY

The OPAL-MD station is part of the OPAL family of test stations dedicated to PIC testing, offering different performance, capability and throughput levels.

FEATURES

Work Area:
50x50/100x100/Φ300mm
Coupling Mode:
Surface&Edge Coupling
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